Reliability Prediction — This document provides an electronics failure rate prediction standard, and establishes a Community of Practice. It addresses the limitations of existing prediction practices with a series of subsidiary specifications that contain the “best practices” within industry for performing electronics failure rate predictions. The development of ANSI/VITA 51.0 and the subsidiary specifications is an effort to give the mean time between failure (MTBF) calculations consistency and repeatability. 

Designation corrected to ANSI/VITA 51 - 2012 (R2018). Standard was revised in 2012 and reaffirmed with no changes in 2018.

  • Item #: AV51.0

ANSI/VITA 51.0-2012 (R2018), Reliability Prediction

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