Reliability Prediction — This document provides an electronics failure rate prediction standard, and establishes a Community of Practice. It addresses the limitations of existing prediction practices with a series of subsidiary specifications that contain the “best practices” within industry for performing electronics failure rate predictions. The development of ANSI/VITA 51.0 and the subsidiary specifications is an effort to give the mean time between failure (MTBF) calculations consistency and repeatability.

  • Item #: AV51.0

ANSI/VITA 51.0-2008 (R2012), Reliability Prediction

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